Scanning electrochemical microscopy with oscillating probe tip
US11921130B2 · kind B2 · utility
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Key dates
| Filing date | Jan 11, 2021 |
| Grant date | Mar 5, 2024 |
| Priority date | — |
| Expiry date | Nov 9, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/12965
- WIPO fieldCivil engineering
- WIPO sectorOther fields
Abstract
A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.