Multi-parameter dynamic sampling method and multi-parameter dynamic sampling device

US11921499B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Zhu Niu · Beijing, CN
• Bo Wen · New York, US
• Shun Jie Fan · Beijing, CN

Key dates

• Filing date: Jul 21, 2020
• Grant date: Mar 5, 2024
• Expiry date: Jul 21, 2040

Classification

• Technology area (CPC H): Electricity
• CPC primary: H04L43/08
• WIPO field: Control
• WIPO sector: Instruments

Abstract

The present disclosure describes multi-parameter dynamic sampling methods and systems. An example method includes: configuring two sampling rates for each parameter in a set of sampling parameters; selecting one of the sampling rates for each parameters to sample it; calculating a load for each parameter at the selected sampling rate, sorting the parameters according to the loads, and determining high-loaded parameters according to a sorting result; and determining whether each parameter has data loss, and if at least one of the sampling parameters has data loss, performing down-sampling on the high-loaded sampling parameters within a range of the configured at least two sampling rates.