Techniques for adapting time delays of ultrasound inspection system during data acquisition
US11927565B2 · kind B2 · utility
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24Claims
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Key dates
| Filing date | Feb 22, 2022 |
| Grant date | Mar 12, 2024 |
| Priority date | — |
| Expiry date | Sep 16, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques for compensating a TFM delay computation live (e.g., during acquisition) as a function of the measured thickness along the scan axis of a probe of an acoustic inspection system. At various scan positions, the acoustic inspection system can measure the thickness of the object under test. With the measured thickness, the acoustic inspection system can compute the delays used for the TFM computation to reflect the actual thickness at that particular scan position of the probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.