Systems, methods, and devices for defect detection in capacitive touch panels
US11928284B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 10, 2022 |
| Grant date | Mar 12, 2024 |
| Priority date | — |
| Expiry date | Mar 10, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D18/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, and devices detect defects in touch panels. Methods include scanning, using a designated integration window, a plurality of electrodes of a sensing device to obtain a plurality of measurements and determining a plurality of variance values for the plurality of electrodes based on the plurality of measurements, the plurality of variance values identifying variances in the plurality of measurements between adjacent sense locations of the sensing device. Methods also include determining if a defect is present in the sensing device based, at least in part, on a comparison of the plurality of difference values with the plurality of threshold values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.