Method for the detection and quantification of nano or micro plastic particles
US11933740B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2020 |
| Grant date | Mar 19, 2024 |
| Priority date | — |
| Expiry date | Dec 24, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/442
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for the detection of at least one nano or micro plastic particle comprised in a heterogeneous matrix material comprising the following steps: applying of at least one part of a heterogeneous matrix material comprising at least one nano or micro plastic particle onto at least a portion of a surface of a conductive support thereby forming a first layer onto said surface, irradiating of at least a portion of said first layer with at least one ion beam, thereby forming an irradiated layer, detecting of the at least one nano or micro plastic particle comprised in said irradiated layer by a detection method chosen from the group of Raman nanoscopic techniques, or infrared nanoscopic techniques, or charge dependent detection methods or combination thereof. The present invention allowed good detection of micro and nano plastic particles with high resolution and sensitivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.