Method for evaluating quality of graphene
US11933955B2 · kind B2 · utility
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Key dates
| Filing date | Oct 14, 2021 |
| Grant date | Mar 19, 2024 |
| Priority date | — |
| Expiry date | Dec 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of evaluating quality of graphene using a confocal laser scanning microscope, the method comprising steps of: irradiating with laser light a graphene layer formed on a catalyst layer; detecting a signal of light reflected from the graphene layer; forming a planar image of the graphene layer using the detected optical signal; and analyzing a contrast between graphene and the catalyst layer in the planar image, wherein the graphene layer is continuously formed on the catalyst layer by a roll-to-roll process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.