Predicting medical device failure based on operational log data
US11935646B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 26, 2019 |
| Grant date | Mar 19, 2024 |
| Priority date | — |
| Expiry date | May 11, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H40/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques are disclosed to predict medical device failure based on operational log data. Log data associated with a plurality of devices comprising a population of devices each having a same target part subject to failure. For each of at least a subset of the plurality of devices replacement dates on which the target part was replaced in that device are determined. A set of logged event data with prescribed severity is extracted from the log data for said plurality of devices. A subset of the logged event data is identified as being associated with impending failure of the target part. The subset of the logged event data is transformed into a normalized form. The normalized subset of the logged event data is used to generate a failure prediction model to predict failure of the target part in a device based on the current event logs from that device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.