Method for autonomously detecting and repairing defects in a workpiece in surface finishing applications
US11938632B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2023 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | May 2, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/004
- WIPO fieldHandling
- WIPO sectorMechanical engineering
Abstract
A method includes: compiling lower-resolution images, captured during a global scan cycle executed over a workpiece, into a virtual model; defining a nominal toolpath and a nominal target force for the workpiece based on a the virtual model; detecting a defect indicator on the workpiece based on the lower-resolution images; accessing a higher-resolution image captured during a local scan cycle over the defect indicator; characterizing the defect indicator as a defect reparable via material removal based on the higher-resolution image; defining a repair toolpath for the defect based on the virtual model; navigating a sanding head over the workpiece according to the repair toolpath to repair the defect; and, during a processing cycle: navigating the sanding head across the workpiece according to the nominal toolpath and deviating the sanding head from the nominal toolpath to maintain forces of the sanding head on the workpiece proximal the nominal target force.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.