Feature-guided scanning trajectory optimization method for three-dimensional measurement robot
US11938636B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 23, 2023 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | May 23, 2043 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02T90/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A feature-guided scanning trajectory optimization method for a 3D measurement robot, including: building a 3D digital model of an aircraft surface; obtaining a size of the 3D digital model; extracting features to be measured; classifying the features to be measured; calculating a geometric parameter of each type of features to be measured; generating an initial scanning trajectory of each type of features to be measured; building a constraint model of the 3D measurement robot; optimizing the initial scanning trajectory into a local optimal scanning trajectory; and planning a global optimal scanning trajectory of each type of features to be measured on the aircraft surface by using a modified ant colony optimization algorithm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.