Feature location detection utilizing depth sensor
US11940269B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2023 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | Sep 29, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for determining a location of a feature of an object, the system including a first marker including a first area and a surface having two parallel edges and a third edge disposed perpendicularly to the two parallel edges, the two parallel edges are disposed about a first central axis of the two parallel edges; and a sensor configured to provide a distance from the sensor to a portion of the first marker, wherein the sensor is adapted to obtain distances between the sensor and the first marker and an environment surrounding the first marker to form a first map representing the distances corresponding to locations from which the distances are obtained using the sensor and the location of the feature of the object is determined based on at least one corner corresponding to an intersection formed of the third edge and one of the two parallel edges.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.