Method for pre-detecting defective porous polymer substrate for separator
US11940368B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2022 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | Apr 6, 2042 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E60/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method for pre-detecting a defective porous polymer substrate for a separator, including selecting a porous polymer substrate having a plurality of pores; observing the selected porous polymer substrate with a scanning electron microscope (SEM) to obtain an image of the porous polymer substrate; quantifying the average value of pore distribution index (PDI); correcting the quantified average value of pore distribution index to obtain the corrected average value of pore distribution index; determining whether or not the corrected average value of pore distribution index is 60 a.u. (arbitrary unit) or less; and classifying the porous polymer substrate as a good product, when the corrected average value of pore distribution index is determined to be 60 a.u. or less, and classifying the porous polymer substrate as a defective product, when the corrected average value of pore distribution index is determined to be larger than 60 a.u.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.