Device for recognizing defects in finished surface of product
US11940389B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2021 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | Aug 4, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8918
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device to detect and analyze defects in magnified scale images of a surface of a finished product illuminated with a blue light source and viewed by multiple image-capturing devices each focused on their own spot includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a blue light source assembly. The processor is used to connect to a camera assembly, and preprocess the image of the front of the product to obtain a detection and analysis of any defects of the front of the product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.