Systems and methods for data representation in an optical measurement system
US11941857B2 · kind B2 · utility
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50References
15Claims
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Key dates
| Filing date | May 19, 2021 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | Jun 24, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2027/014
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An illustrative method includes accessing, by a computing device, a model simulating light scattered by a simulated target, the model comprising a plurality of parameters. The method further includes generating, by the computing device, a set of possible histogram data using the model with a plurality of values for the parameters. The method further includes determining, by the computing device, a set of components that represent the set of possible histogram data, the set of components having a reduced dimensionality from the set of possible histogram data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.