Coating thickness measurement instrument
US11946740B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2021 |
| Grant date | Apr 2, 2024 |
| Priority date | — |
| Expiry date | Nov 17, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A coating thickness measuring instrument comprising: a magnetic induction probe comprising at least one drive coil and at least one pick-up coil; a driver for driving an alternating current in the or each drive coil; and a detector for detecting the output of the or each pick-up coil; and a processor configured to: apply a transfer function to the detector output to produce an output which corresponds to a measured coating thickness; and, scale both the drive current and detector output simultaneously in response to the output. The scaling may be changed in a step-wise manner. The scaling applied to the drive current may be inversely proportional to the scaling applied to the detector output. The scaling may be defined by a first and second scaling factor, stored as a pair. The instrument may store two or more pairs of scaling factors and select a pair in response to the measured coating thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.