Patent · US Active

Measurement setup, reference reflector as well as method for measuring attenuation

US11947001B2 · kind B2 · utility

0Cited by

6References

20Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Sherif Ahmed · Starnberg, DE
Frank Gumbmann · Munich, DE
Tobias Koeppel · Munich, DE
Michael Freissl · Munich, DE
Christian Evers · Tauberbischofsheim, DE
Thomas Fischer · Umkirch, DE

Key dates

Filing date	Feb 18, 2021
Grant date	Apr 2, 2024
Priority date	—
Expiry date	Sep 10, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01S7/4056
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.