Systems and methods for detecting flaws on panels using images of the panels
US11948292B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2020 |
| Grant date | Apr 2, 2024 |
| Priority date | — |
| Expiry date | Mar 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30136
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a non-transitory computer readable medium storing a computer program, in which when the computer program is executed by one or more processors of a computing device, the computer program performs operations to provide methods for detecting flaws, and the operations may include: extracting a flaw patch from a flaw image including a flaw; preprocessing at least one of the flaw image or non-flaw image not including a flaw; extracting a non-flaw patch from at least one of the preprocessed flaw image or non-flaw image; and training a neural network model for classifying patches to flaw or non-flaw with a training data set including the flaw patch and the non-flaw patch.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.