Measurement method and measurement apparatus
US11948323B2 · kind B2 · utility
0Cited by
0References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 5, 2023 |
| Grant date | Apr 2, 2024 |
| Priority date | — |
| Expiry date | Apr 5, 2043 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E60/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of this application provide a measurement method and a measurement apparatus. The measurement method includes: acquiring a first image and a second image of a target object, where the first image is acquired by a camera located on a non-backlight side of the target object, and the second image is acquired by a camera located on a backlight side of target object; and measuring the target object for size information according to the first image and the second image. The technical solution of this application can improve accuracy and precision of inspection while improving production efficiency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.