Patent · US Active

Calibration tool for planar chip applications

US11953382B2 · kind B2 · utility

0Cited by

1References

14Claims

0Family size

Assignee

STRATEC SE · DE

Inventors

Manuel Kunz · Oettingen, DE
Daniel Ahr · Retzstadt, DE
Martin Trump · Newbury, GB
Rüdiger Retzlaff · Neuenbürg, DE

Key dates

Filing date	Aug 9, 2020
Grant date	Apr 9, 2024
Priority date	—
Expiry date	Dec 10, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01N2035/00366
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system comprising a device or the device itself for measuring temperatures, comprising a sensor array plate, comprising on a first surface at least one temperature sensor arranged on at least one tongue that is surrounded by a cut-out leaving a bridge to the sensor array plate, wherein the at least one sensor has on both sides' spacer and a second surface opposite the first surface for connection to at least one operating plate of a thermocycler; and a pressure plate, comprising fins at the side for connection to the sensor array plate that align with the spacer of the sensor array plate when a pressure plate is arranged onto a sensor array plate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.