Method for reducing analyzer variability using a normalization target
US11953428B2 · kind B2 · utility
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34References
20Claims
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Key dates
| Filing date | Oct 22, 2020 |
| Grant date | Apr 9, 2024 |
| Priority date | — |
| Expiry date | Dec 11, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12761
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is a method for improving the precision of a test result from an instrument with an optical system that detects a signal. The method comprises including in the instrument a normalization target disposed directly or indirectly in the optical path of the optical system. Also disclosed are instruments comprising a normalization target, and systems comprising such an instrument and a test device that receives a sample suspected of containing an analyte.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.