Modular automated test system
US11953519B2 · kind B2 · utility
0Cited by
441References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 22, 2020 |
| Grant date | Apr 9, 2024 |
| Priority date | — |
| Expiry date | Mar 4, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.