Determining image feature height disparity
US11954878B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2023 |
| Grant date | Apr 9, 2024 |
| Priority date | — |
| Expiry date | Mar 15, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30252
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
A device to determine a height disparity between features of an image includes a memory including instructions and processing circuitry. The processing circuitry is configured by the instructions to obtain an image including a first repetitive feature and a second repetitive feature. The processing circuitry is further configured by the instructions to determine a distribution of pixels in a first area of the image, where the first area includes an occurrence of the repetitive features, and to determine a distribution of pixels in a second area of the image, where the second area includes another occurrence of the repetitive features. The processing circuitry is further configured by the instructions to evaluate the distribution of pixels in the first area and the distribution of pixels in the second area to determine a height difference between the first repetitive feature and the second repetitive feature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.