Patent · US Active

Laboratory experiment data exploration and visualization

US11955207B2 · kind B2 · utility

0Cited by

2References

7Claims

0Family size

Assignee

Emerald Cloud Lab, Inc. · US

Inventors

Alex M. Yoshikawa · South San Francisco, US
Anand Sastry · Los Altos Hills, US
Asuka Ota · South San Francisco, US
Ben C. Kline · South San Francisco, US
Bradley M. Bond · Palo Alto, US
Brian M. Frezza · Redwood City, US
Cameron R. Lamoureux · South San Francisco, US
Catherine L. Hofler · San Francisco, US
Cheri Y. Li · South San Francisco, US
Courtney E. Webster · South San Francisco, US
Daniel J. Kleinbaum · Redwood City, US
George N. Stanley · South San Francisco, US
George W. Fraser · Mountain View, US
Guillaume Robichaud · South San Francisco, US
Hayley E. Buchman · South San Francisco, US
James R. McKernan · South San Francisco, US
Jonathan Leung · Sunnyvale, US
Paul R. Zurek · South San Francisco, US
Robert M. Teed · South San Francisco, US
Ruben E. Valas · South San Francisco, US
Sean M. Fitzgerald · South San Francisco, US
Sergio I. Villarreal · South San Francisco, US
Shayna L. Hilburg · South San Francisco, US
Shivani S. Baisiwala · South San Francisco, US
Srikant Vaithilingam · South San Francisco, US
Wyatt J. Woodson · South San Francisco, US
Yang Choo · South San Francisco, US
Yidan Y. Cong · South San Francisco, US

Key dates

Filing date	Jun 30, 2016
Grant date	Apr 9, 2024
Priority date	—
Expiry date	Aug 25, 2039

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY02A90/10
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The disclosure provides systems and methods for data analysis of experimental data. The analysis can include reference data that are not directly generated from the present experiment, which reference data may be values of the experimental parameters that were either provided by a user, computed by the system with input from a user, or computed by the system without using any input from a user. Another example of such reference data may be information about the instrument, such as the calibration method of the instrument.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.