Cryogenic analysis systems and methods
US11959845B1 · kind B1 · utility
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21Claims
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Key dates
| Filing date | Mar 18, 2022 |
| Grant date | Apr 16, 2024 |
| Priority date | — |
| Expiry date | Jun 15, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Cryogenic device analysis systems are provided that can include: a cold source within a first vacuum chamber; a cryogenic device mount within a second vacuum chamber, wherein the first and second vacuum chambers are separated by a vacuum barrier; a first thermal conduit extending from the cold source through the vacuum barrier to the sample mount; a first thermal switch along the first thermal conduit and operatively aligned between the cold source and the vacuum barrier. Methods for performing analysis of a cryogenic device are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.