Integrated circuit package with internal circuitry to detect external component parameters and parasitics
US11959962B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2022 |
| Grant date | Apr 16, 2024 |
| Priority date | — |
| Expiry date | Jun 23, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2611
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and techniques for an integrated circuit (IC) package to automatically detect, through an input/out pin, external component parameters and parasitics. An example IC package generally includes a pin for coupling to a component external to the IC package, and at least one of a resistance detector, an inductance detector, or a capacitance detector coupled to the pin, and configured to detect at least one of a resistance, an inductance, or a capacitance, respectively, of a lumped parameter model for the component external to the IC package. The resistance detector, inductance detector, or capacitance detector may also be configured to detect parasitics associated with at least one of the component, the pin, or a connection between the component and the pin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.