Method and apparatus for obtaining transmitter test parameter, and storage medium
US11962344B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2022 |
| Grant date | Apr 16, 2024 |
| Priority date | — |
| Expiry date | Jun 3, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/524
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Embodiments of this application provide a method and an apparatus for obtaining a transmitter test parameter, and a storage medium. The method includes: performing waveform sampling on an optical signal sent by a transmitter, to obtain a sampled electrical signal, obtaining a first noise amount associated with the sampled electrical signal based on a preset initial noise ratio parameter and a level amplitude of the sampled electrical signal, and obtaining a second noise amount associated with an ideal electrical signal based on the initial noise ratio parameter and a level amplitude of the ideal electrical signal. According to the application, a noise amount associated with a level amplitude of a sampled electrical signal is obtained without limiting a type of a receiver that performs a consistency test on a transmitter by using a transmitter test parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.