Test device for localizing a partial discharge in or at an electrical component as well as method for localizing the partial discharge
US11965925B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 22, 2022 |
| Grant date | Apr 23, 2024 |
| Priority date | — |
| Expiry date | Sep 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test device to localize a partial discharge in or at an electrical component may include at least one antenna to capture an electromagnetic wave caused by a partial discharge in the electrical component. The test device includes multiple microphones arranged in an environment around the electrical component. The microphones capture sound waves caused by the partial discharge. It is examined if an intensity of the electromagnetic wave exceeds a first limit value and/or the intensity of the sound wave captured by one of the multiple microphones exceeds a second limit value. Depending on the captured sound wave and/or the electromagnetic wave and on the examination relating to the first and/or second limit value, a location of the partial discharge can be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.