Object deformation determination
US11967037B2 · kind B2 · utility
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7Claims
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Key dates
| Filing date | Jan 17, 2020 |
| Grant date | Apr 23, 2024 |
| Priority date | — |
| Expiry date | Feb 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2021
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Examples of methods for object deformation determination are described herein. In some examples, a method includes aligning a first bounding box of a three-dimensional (3D) object model with a second bounding box of a scan. In some examples, the method includes determining a deformation between the 3D object model and the scan based on the alignment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.