Device and method for measuring wavelength for laser device

US11971307B2 · kind B2 · utility

Assignee

• Beijing RSLaser Opto-Electroncis Technology Co., Ltd. · CN

Inventors

• Guangyi Liu · San Jose, US
• Rui Jiang · Beijing, CN
• Xiaoquan Han · Beijing, CN
• Jiangshan Zhao · Beijing, CN
• Pengfei Sha · Beijing, CN
• Qingqing Yin · Beijing, CN
• Hua Zhang · Hangzhou City, CN

Key dates

• Filing date: Dec 11, 2020
• Grant date: Apr 30, 2024
• Expiry date: Dec 11, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2009/0257
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

According to the present disclosure, there is provided a device (2) and a method for measuring a wavelength for a laser device. The device (2) for measuring a wavelength for a laser device includes: a first optical path assembly and a second optical path assembly. The first optical path assembly and the second optical path assembly constitute a laser wavelength measurement optical path. The second optical path assembly includes: an FP etalon assembly (11) and an optical classifier (13). The homogenized laser beam passes through the FP etalon assembly (11) to generate an interference fringe. The optical classifier (13) is arranged after the FP etalon assembly (11) in the laser wavelength measurement optical path, and configured to deflect the laser beam passing through the FP etalon assembly (11).