Monitoring mirror reflectance using solar illumination
US11971321B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 22, 2019 |
| Grant date | Apr 30, 2024 |
| Priority date | — |
| Expiry date | Mar 15, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02S40/22
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system (100) and method can monitor a reflectance of a mirror target that includes at least one curved mirror (M). The system (100) can take a first irradiance measurement of the sun (S), the first irradiance measurement representing a direct solar irradiance. The system (100) can take a second irradiance measurement that represents an irradiance from a reflection of the sun (S) from the mirror target plus background irradiance from a reflection of the sky from the mirror target. The system (100) can take a third irradiance measurement that represents the background irradiance from the reflection of the sky from the mirror target. The system (100) can determine a reflectance of the mirror target from the first, second, and third irradiance measurements. The system (100) can compare the reflectance to a specified reflectance threshold, and, upon determining that the reflectance of the mirror target is less than the specified reflectance threshold, can generate an alert signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.