Patent · US Active

Method for predicting lattice defect in metal-organic framework membrane

US11971340B1 · kind B1 · utility

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4Claims

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Assignee

NANJING TECH UNIVERSITY · CN

Inventors

Gongping Liu · Atlanta, US
Guozhen Liu · Indianapolis, US
Wanqin Jin · 安丰镇, CN

Key dates

Filing date	Oct 31, 2023
Grant date	Apr 30, 2024
Priority date	—
Expiry date	Oct 31, 2043

Classification

Technology area (CPC G)Physics
CPC primaryG01N2015/084
WIPO fieldChemical engineering
WIPO sectorChemistry

Abstract

The present disclosure provides a method for predicting a lattice defect in a metal-organic framework (MOF) membrane. The method comprises acquiring a number n of a ligand during preparation of the MOF membrane, and acquiring a theoretical number m of connections formed between a core secondary building unit and a surrounding secondary building unit; setting a number of collisions of the ligand with the core secondary building unit and the surrounding secondary building unit; and calculating an expected value of a number of connections formed on lattices based on a collision probability, wherein the number of collisions is 1 or 2.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.