Patent · US Active

Method and microscope for determining the thickness of a cover slip or slide

US11971531B2 · kind B2 · utility

0Cited by

2References

17Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Alexander W. Weiss · Linden, DE
Christian Schumann · Gießen, DE
Ronja Capellmann · Wetzlar, DE

Key dates

Filing date	Oct 18, 2019
Grant date	Apr 30, 2024
Priority date	—
Expiry date	Mar 3, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/0088
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A method is useable for determining a thickness of a cover slip or object carrier in a microscope, which has an objective facing toward a sample chamber. Two optical media border two opposing surfaces of the cover slip or object carrier and form two partially reflective interfaces, which are arranged at different distances from the objective. The method includes: deflecting a measurement light beam by the objective with oblique incidence on the cover slip or object carrier; generating two reflection light beams spatially separated from one another by the measurement light beam being partially reflected on each of the two interfaces; receiving the two reflection light beams by the objective and conducting them onto a position-sensitive detector; registering the incidence locations on the position-sensitive detector; and determining the thickness of the cover slip or object carrier based on the registered incidence locations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.