Method for selecting image samples and related equipment
US11972601B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2020 |
| Grant date | Apr 30, 2024 |
| Priority date | — |
| Expiry date | Oct 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to a technology field of artificial intelligence and provides a method for selecting image samples and related equipment. The method trains an instance segmentation model with first image samples and trains a score prediction model with third image samples. An information quantum score of second image samples is calculated through the score prediction model and feature vectors extracted. The second image samples are clustered according to the feature vectors of the second image samples and sample clusters of the second image samples are obtained. Target image samples are selected from the second image samples according to the information quantum score of the second image samples and the sample clusters. Target image samples from the image samples are selected for labelling, improving an accuracy of sample selection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.