Patent · US Active

Automated test plan validation for object measurement by a coordinate measuring machine

US11976920B2 · kind B2 · utility

0Cited by
0References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 8, 2020
Grant dateMay 7, 2024
Priority date
Expiry dateDec 23, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.