Patent · US Active

Module and method for monitoring environmental influences on a module including multiple stress measuring cells

US11976987B2 · kind B2 · utility

0Cited by
18References
15Claims
0Family size

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Key dates

Filing dateJun 13, 2022
Grant dateMay 7, 2024
Priority date
Expiry dateAug 6, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L25/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A module, including at least one first component in the form of a semiconductor component including multiple stress measuring cells situated in a distributed manner for detecting stress measured values at different measuring positions of the semiconductor component, at least one second component which is mechanically coupled to the semiconductor component, and an evaluation unit, which is designed to ascertain at least one location-dependent stress distribution in the semiconductor component based on the stress measured values detected at one measuring point in time, and to ascertain a deformation state of the at least one second component at the measuring point in time on the basis of the at least one ascertained location-dependent stress distribution in the semiconductor component. A corresponding method for monitoring environmental influences on a module is also described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.