Optical inspection of the varactor diodes in varactor metasurface antenna
US11978958B2 · kind B2 · utility
0Cited by
2References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2022 |
| Grant date | May 7, 2024 |
| Priority date | — |
| Expiry date | Jan 10, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q15/0066
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Methods and apparatuses for performing optical inspection of varactor diodes in an antenna are disclosed. In some embodiments, the method of testing an antenna having varactor diodes comprises: selecting a plurality of varactor diodes to be placed in a light emitting state; forward biasing the selected varactor diodes to a magnitude at which the selected varactor diodes are to emit light; and detecting one or more faulty varactor diodes of the selected varactor diodes based on their emitted light intensity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.