System and method for detecting defects on imaged items
US11982628B2 · kind B2 · utility
0Cited by
2References
16Claims
0Family size
Assignee
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Key dates
| Filing date | May 10, 2019 |
| Grant date | May 14, 2024 |
| Priority date | — |
| Expiry date | May 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the invention provide a machine learning based detection system, in which defects can be detected even if the system was not trained for these defects and even in items that were not used to train the system, thereby offering an inherently flexible detection system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.