Device for recognizing defects in finished surface of product
US11982629B2 · kind B2 · utility
0Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2021 |
| Grant date | May 14, 2024 |
| Priority date | — |
| Expiry date | Dec 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30156
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device to detect and analyze defects in a finished surface includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a light source assembly. The processor is used to connect to a first camera module and a second camera module, and preprocess the first image and the second image to obtain a detection and analysis of any defects of the front of the product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.