Systems and methods to detect and measure the current mismatch among parallel semiconductor devices
US11982693B2 · kind B2 · utility
0Cited by
2References
18Claims
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Key dates
| Filing date | Oct 10, 2019 |
| Grant date | May 14, 2024 |
| Priority date | — |
| Expiry date | Apr 29, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P70/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatuses and methods of the present disclosure integrate a non-intrusive current sensor in the form of a current mismatch sensor into a power module having paralleled semiconductor structures or components. The current mismatch can be detected by the current sensor by monitoring a magnetic flux density between the paralleled components or devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.