Intersection testing in a ray tracing system using convex polygon edge parameters
US11983811B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2023 |
| Grant date | May 14, 2024 |
| Priority date | — |
| Expiry date | Feb 8, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/21
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Intersection testing is performed for a ray with respect to a plurality of convex polygons, each of which is defined by an ordered set of vertices, wherein a shared vertex is used to define at least two of the convex polygons. The vertices of the convex polygons are projected onto a pair of axes orthogonal to the ray direction. A vertex ordering scheme defines an ordering of the projected vertices which is independent of the ordering of the vertices in the ordered sets. For each of the convex polygons, for each edge of the convex polygon defined by two of the projected vertices, a parameter indicative of which side of the edge the ray passes on is determined, wherein if the ray is determined to intersect a point on the edge then the parameter is determined based upon whether the ordering of the projected vertices defining the edge matches the ordering of the vertices in the ordered set of vertices defining the convex polygon. Whether the ray intersects the convex polygon is determined based on the parameters determined for the edges of the convex polygon.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.