Calibration method and calibration apparatus for delay of quantum computer system
US11984895B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2023 |
| Grant date | May 14, 2024 |
| Priority date | — |
| Expiry date | Nov 27, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00058
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A calibration method and a calibration apparatus for a delay of a quantum computer system, wherein when the calibration method is implemented, a first control signal is first applied to the qubit on the quantum chip through the first transmission line, simultaneously a second control signal with a preset delay is applied to the qubit through the second transmission line, then the preset delay is updated sequentially within a preset range, and the second control signal with updated preset delay is applied to the qubit, so as to obtain a change curve representing a probability of the quantum state of the qubit being an eigenstate as a function of the preset delay, and then it is determined whether the change curve has a trough, if the change curve has a trough, finally, delay calibration is performed for the first transmission line and the second transmission line based on the preset delay corresponding to the trough of the change curve, so as to eliminate the transmission delay caused by different line lengths and different microwave devices added on the lines, so that the control signals on different lines can reach the quantum chip according to the designed time sequence, thereby …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.