Patent · US Active

Method of cleaning, support, and cleaning apparatus

US11986869B2 · kind B2 · utility

0Cited by
1References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2022
Grant dateMay 21, 2024
Priority date
Expiry dateJun 6, 2042

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB08B2209/032
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A method of cleaning includes placing a semiconductor device manufacturing tool component made of quartz on a support. A cleaning fluid inlet line is attached to a first open-ended tubular quartz projection extending from an outer main surface of the semiconductor device manufacturing tool component. A cleaning fluid is applied to the semiconductor device manufacturing tool component by introducing the cleaning fluid through the cleaning fluid inlet line and the tubular quartz projection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.