Patent · US Active

Measurement of a dynamic system

US11988583B2 · kind B2 · utility

0Cited by
19References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2019
Grant dateMay 21, 2024
Priority date
Expiry dateSep 29, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0221
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for performing measurements includes providing relative movement between a receptacle and a cover over a measurement interval comprising multiple non-overlapping time periods. A distance between the receptacle and the cover changes along a first axis over at least a portion of each time period. An apparatus for performing measurements includes a receptacle comprising a substrate and a plurality of wells within the substrate, and a cover. The cover includes: (1) a device configured to engage with the receptacle, (2) a control subsystem configured to provide relative movement between the receptacle and the cover, and (3) a measurement subsystem.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.