Integrated sample processing system with multiple detection capability
US11988670B2 · kind B2 · utility
0Cited by
2References
19Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Jul 25, 2022 |
| Grant date | May 21, 2024 |
| Priority date | — |
| Expiry date | Jul 25, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated sample processing system including an analyzer and a mass spectrometer is disclosed. The integrated sample processing system can perform multiple different types of detection, thereby providing improved flexibility and better accuracy in processing samples. The detection systems in the sample processing system may include an optical detection system and a mass spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.