Exposure monitor device

US11988708B2 · kind B2 · utility

Assignee

• Analog Devices International Unlimited Company · IE

Inventors

• Edward John Coyne · Athenry, IE
• Alan J. O'Donnell · Limerick, IE
• Shaun Bradley · Murroe, IE
• David Aherne · Limerick, IE
• David Boland · Limerick, IE
• Thomas G. O'Dwyer · Arlington, US
• Colm Patrick Heffernan · Limerick, IE
• Kevin B. Manning · Andover, US
• Mark Forde · Nenagh, IE
• David J. Clarke · Bramford, GB
• Michael A. Looby · Limerick, IE

Key dates

• Filing date: May 16, 2023
• Grant date: May 21, 2024
• Expiry date: May 16, 2043

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2874
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.