System capable of detecting failure of component of system and method thereof
US11988709B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 27, 2021 |
| Grant date | May 21, 2024 |
| Priority date | — |
| Expiry date | Oct 12, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/063
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This disclosure proposes an inventive system capable of testing a component in the system during runtime. The system may comprise: a substrate; a plurality of functional components, of the plurality of functional components being mounted onto the substrate and including a circuitry; a system bus formed with electrically conductive pattern onto the substrate thereby allowing the plurality of functional components to communicate with each other; one or more wrappers, each of the one or more wrappers connected to one of the plurality of functional components; and an in-system component tester (ICT) configured to: select, as a component under test (CUT), at least one functional component, in an idle state, of the plurality of the functional components; and test, via the one or more test wrappers, the at least one functional component selected as the CUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.