Abnormality detection apparatus, abnormality detection system, and learning apparatus, and methods for the same and non-temporary computer-readable medium storing the same
US11989013B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 18, 2019 |
| Grant date | May 21, 2024 |
| Priority date | — |
| Expiry date | Feb 5, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/088
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An abnormality detection apparatus (200) includes storage means (210) for storing a learned self-encoder (211) including predetermined number of two or more of elements as input layers, extraction means (220) for extracting a target data group of a predetermined period including data pieces from time series data measured by one or more sensors, the number of the data pieces being the predetermined number, conversion means (230) for converting the target data group into multi-dimensional vector data including the predetermined number of elements, identifying means (240) for identifying a time period in which there may be a cause of an abnormality from the predetermined period based on a difference between output vector data having the predetermined number of elements obtained by inputting the multi-dimensional vector data to the self-encoder (211) and the multi-dimensional vector data, and output means (250) for outputting abnormality detection information including the identified time period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.