Depth measurement through display
US11989896B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2020 |
| Grant date | May 21, 2024 |
| Priority date | — |
| Expiry date | Jan 29, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed herein is a display device includingan illumination source for projecting an illumination pattern including a plurality of illumination features on a scene;an optical sensor for determining a first image including a plurality of reflection features;a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; andan evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles,unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.