Gas analysis device and method for detecting sample gas

US11994492B2 · kind B2 · utility

Assignee

• NUCTECH COMPANY LIMITED · CN

Inventors

• Yan Wang · Chamblee, US
• Qingjun Zhang · Beijing, CN
• Yuanjing Li · Beijing, CN
• Zhiqiang Chen · Beijing, CN
• Jianmin Li · Beijing, CN
• Yaohong Liu · Beijing, CN
• Ge Li · Tangxia, CN
• Zhongyuan Hao · Beijing, CN
• Nei Yang · Beijing, CN
• Guangqin Li · Beijing, CN

Key dates

• Filing date: Jun 14, 2022
• Grant date: May 28, 2024
• Expiry date: Jul 23, 2042

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01J49/4265
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.