Patent · US Active

Methods and systems for scanning probe sample property measurement and imaging

US11994533B2 · kind B2 · utility

0Cited by
2References
46Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 2020
Grant dateMay 28, 2024
Priority date
Expiry dateOct 28, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01Q60/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.