Methods and systems for scanning probe sample property measurement and imaging
US11994533B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2020 |
| Grant date | May 28, 2024 |
| Priority date | — |
| Expiry date | Oct 28, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.