Sample mount for electron backscatter diffraction
US11996264B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2023 |
| Grant date | May 28, 2024 |
| Priority date | — |
| Expiry date | Sep 6, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/20214
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A sample mount having a bottom surface, a front surface, and a second portion is disclosed. The first portion is perpendicular to the bottom surface. The second portion has an external surface and an internal surface and extends from the first portion to form a 70-degree angle relative to the bottom surface. The sample mount may also have a top surface, an opening extending through the second portion of the front surface, and a receiving area configured to receive a sample, wherein the top surface presents an unimpeded path between the sample and an SEM pole piece. The sample mount may include a spring-loaded handle configured to push the sample against the internal surface of the second portion of the front surface, wherein pushing the sample against the internal surface places the sample at the 70-degree angle relative to the bottom surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.